Panalytical X’Pert X-Ray Diffractometer (XRD)

Philips X’Pert X-Ray Diffractometer (XRD)

Specifications

  • Angles between 10-135 degrees 2theta
  • Suitable for inorganic materials
  • Powders and solid materials at ambient temperatures
  • Particle sizing on nanomaterials
  • Pattern analysis using a ICSD database with 100,000+ material catalog
  • Rietveld analysis

Equipment Usage

Please call 801-581-5303 for training, scheduling ,or quotes