Hitachi S-3000N Scanning Electron Microscope (SEM)

Hitachi S-3000N Scanning Electron Microscope (SEM)

Specifications

  • Secondary electron resolution: 3.5nm to 50nm (sample dependent)
  • Backscatter electron resolution: 5.5nm to 100nm (sample dependent)
  • Magnification: 15 to 100,000x
  • Filament: Tungsten filament
  • Accelerating voltage: 0.3 to 30 kV

Equipment Usage

Please call 801-581-5303 for current pricing and quotes.